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Volumn 234, Issue 1-4, 2004, Pages 480-486

Initial stages of MBE growth and formation of CaF 2 /Si(0 0 1) high-temperature interface

Author keywords

Epitaxial; High temperature interface; MBE

Indexed keywords

ATOMIC FORCE MICROSCOPY; CALCIUM COMPOUNDS; DEPOSITION; ELECTRON DIFFRACTION; HETEROJUNCTIONS; MOLECULAR BEAM EPITAXY; MONOLAYERS; NUCLEATION; PHOTOELECTRON SPECTROSCOPY; PHOTOEMISSION; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; SILICON; SYNCHROTRON RADIATION;

EID: 3342940073     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2004.05.034     Document Type: Conference Paper
Times cited : (18)

References (13)
  • 1
    • 0002952414 scopus 로고    scopus 로고
    • 2 /Si(1 1 1)
    • W.K. Liu, M.B. Santos (Eds.), World Scientific, Singapore
    • 2 /Si(1 1 1), in: W.K. Liu, M.B. Santos (Eds.) Thin Films: Heteroepitaxial Systems, World Scientific, Singapore, 1999.
    • (1999) Thin Films: Heteroepitaxial Systems
    • Olmstead, M.A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.