메뉴 건너뛰기




Volumn 51, Issue 4 I, 2004, Pages 1358-1364

FE-I2: A front-end readout chip designed in a commercial 0.25-μm process for the ATLAS pixel detector at LHC

Author keywords

Active bias distribution; Hybrid pixel sensor; Leakage current compensation; Multlchip module; Shielding technique; Threshold adjustment; Time over threshold

Indexed keywords

ACTIVE BIAS DISTRIBUTION; HYBRID PIXEL SENSOR LEAKAGE CURRENT COMPENSATION; MULTICHIP MODULE; SHEILDING TECHNIQUE; THRESHOLD ADJUSTMENT; TIME OVER THRESHOLD;

EID: 3342915500     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2004.832895     Document Type: Conference Paper
Times cited : (28)

References (7)
  • 1
    • 0033311541 scopus 로고    scopus 로고
    • Radiation tolerant VLSI circuits in standard deep submicron CMOS technologies for the LHC experiments: Practical design aspects
    • Dec.
    • G. Anelli et al., "Radiation tolerant VLSI circuits in standard deep submicron CMOS technologies for the LHC experiments: Practical design aspects," IEEE Trans. Nucl. Sci., vol. 46, pp. 1690-1696, Dec. 1999.
    • (1999) IEEE Trans. Nucl. Sci. , vol.46 , pp. 1690-1696
    • Anelli, G.1
  • 2
    • 0035500987 scopus 로고    scopus 로고
    • The ATLAS pixel front-end readout chips
    • J. Richardson, "The ATLAS pixel front-end readout chips," Nucl. Instrum. Methods A, vol. 473, pp. 157-162, 2001.
    • (2001) Nucl. Instrum. Methods A , vol.473 , pp. 157-162
    • Richardson, J.1
  • 3
    • 0036703153 scopus 로고    scopus 로고
    • Analog front-end cell designed in a commercial 0.25 μm process for the ATLAS pixel detector at LHC
    • Aug.
    • L. Blanquart et al., "Analog front-end cell designed in a commercial 0.25 μm process for the ATLAS pixel detector at LHC," IEEE Trans. Nucl. Sci., vol. 49, pp. 1778-1782, Aug. 2002.
    • (2002) IEEE Trans. Nucl. Sci. , vol.49 , pp. 1778-1782
    • Blanquart, L.1
  • 4
    • 0031207515 scopus 로고    scopus 로고
    • Pixel analog cell prototypes for ATLAS in DMILL technology
    • L. Blanquart, A. Mekkaoui, V. Bonzom, and P. Delpierre, "Pixel analog cell prototypes for ATLAS in DMILL technology," Nucl. Instrum. Methods A, vol. 395, no. 3, pp. 313-317, 1997.
    • (1997) Nucl. Instrum. Methods A , vol.395 , Issue.3 , pp. 313-317
    • Blanquart, L.1    Mekkaoui, A.2    Bonzom, V.3    Delpierre, P.4
  • 5
    • 0030375853 scopus 로고    scopus 로고
    • Upset hardened memory design for submicron CMOS technology
    • Dec.
    • T. Calin, M. Nicolaidis, and R. Velazco, "Upset hardened memory design for submicron CMOS technology," IEEE Trans. Nucl. Sci., vol. 43, pp. 2874-2878, Dec. 1996.
    • (1996) IEEE Trans. Nucl. Sci. , vol.43 , pp. 2874-2878
    • Calin, T.1    Nicolaidis, M.2    Velazco, R.3
  • 6
    • 0036703243 scopus 로고    scopus 로고
    • Digital column readout architecture for the ATLAS pixel 0.25 μm front end IC
    • Aug.
    • E. Mandelli et al., "Digital column readout architecture for the ATLAS pixel 0.25 μm front end IC," IEEE Trans. Nucl. Sci., vol. 49, pp. 1774-1777, Aug. 2002.
    • (2002) IEEE Trans. Nucl. Sci. , vol.49 , pp. 1774-1777
    • Mandelli, E.1
  • 7
    • 0032075075 scopus 로고    scopus 로고
    • An on-chip, interconnect capacitance characterization method with sub-femto-farad resolution
    • May
    • J. C. Chen, D. Sylvester, and C. Hu, "An on-chip, interconnect capacitance characterization method with sub-femto-farad resolution," IEEE Trans. Semiconduct. Manufact., vol. 11, pp. 204-210, May 1998.
    • (1998) IEEE Trans. Semiconduct. Manufact. , vol.11 , pp. 204-210
    • Chen, J.C.1    Sylvester, D.2    Hu, C.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.