Fast estimation of ADC nonlinearities using the Sinewave Histogram Test

Measurement: Journal of the International Measurement Confederation

Volumn 39, Issue 3 SPEC. ISS., 2006, Pages 232-237

  Stefani, F ^a   Moschitta, A ^a   Macii, D ^b   Carbone, P ^a   Petri, D ^b  

^a UNIVERSITY OF PERUGIA   (Italy)

^b UNIVERSITY OF TRENTO   (Italy)

Author keywords

Analog to Digital Converters (ADCs); INL estimation; Sinewave Histogram Test (SHT)

Indexed keywords

COMPUTER SIMULATION; PARAMETER ESTIMATION; THRESHOLD VOLTAGE;

INL ESTIMATION; PATTERN EXHIBITS; SINEWAVE HISTOGRAM TEST (SHT);

ANALOG TO DIGITAL CONVERSION;

EID: 33344465871     PISSN: 02632241     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.measurement.2005.11.003     Document Type: Article

References (11)

1. A. Grochowski, D. Bhattacharya, T.R. Viswanathan, and K. Laker Integrated circuit testing for quality assurance in manufacturing: history, current status, and future trends IEEE Trans. Circ. Syst. II 44 8 1997 610 633
2. IEEE Std. 1241-2000, IEEE Standard for terminology and test methods for analog-to-digital converters.
3. P. Carbone, E. Nunzi, and D. Petri Efficiency of ADC linearity estimators IEEE Trans. Instrum. Measur. 51 4 2002 849 852
4. P. Carbone, and D. Petri Noise sensitivity of the ADC histogram test IEEE Trans. Instrum. Measur. 47 4 1998 1001 1004
5. A. Moschitta, P. Carbone, D. Petri, Statistical performance of Gaussian ADC histogram test, in: Proc. 8th International Workshop on ADC Modelling and Testing (IWADC), Perugia, Italy, September 2003, pp. 213-217.
6. J.M. Janik, Estimation of A/D converter nonlinearities from complex spectrum, in: Proc. 8th International Workshop on ADC Modelling and Testing (IWADC), Perugia, Italy, September 2003, pp. 205-208.
7. F. Adamo, F. Attivissimo, N. Giaquinto, I. Kale, Measuring dynamic nonlinearity of A/D converters via spectral methods, in: Proc. 8th International Workshop on ADC Modelling and Testing (IWADC) 2003, Perugia, Italy, September 2003, pp. 167-170.
8. A.C. Serra, M.F. da Silva, P. Ramos, L. Michaeli, J. Šaliga, Fast ADC testing by spectral analysis, in: Proc. IEEE Instrumentation and Measurement Technology Conference (IMTC), Como, Italy, May 2004, pp. 823-828.
9. C. Wegener, and M.P. Kennedy Linear model-based testing of ADC nonlinearities IEEE Trans. Circ. Syst. I 51 1 2004 213 217
10. J. Blair Histogram measurement of ADC nonlinearities using sine waves IEEE Trans. Instrum. Measur. 43 3 1994 373 383
11. ISO ENV 13005:1999, Guide to the Expression of Uncertainty in Measurements.