Linear model-based testing of ADC nonlinearities

IEEE Transactions on Circuits and Systems I: Regular Papers

Volumn 51, Issue 1, 2004, Pages 213-217

  Wegener, Carsten ^a   Kennedy, Michael Peter ^a  

^a UNIVERSITY COLLEGE CORK   (Ireland)

Author keywords

[No Author keywords available]

Indexed keywords

ANALOG TO DIGITAL CONVERSION; MATHEMATICAL MODELS; NYQUIST DIAGRAMS; PARAMETER ESTIMATION; PROBABILITY DENSITY FUNCTION; SPURIOUS SIGNAL NOISE;

INTEGRAL NONLINEARITY; LINEAR MODELING; MEASUREMENT NOISE; NOISE INDUCED TEST UNCERTAINTY;

INTEGRATED CIRCUIT TESTING;

EID: 4644255843     PISSN: 10577122     EISSN: None     Source Type: Journal    
DOI: 10.1109/TCSI.2003.821281     Document Type: Article

References (11)

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