Fast ADC testing by spectral and histogram analysis

Conference Record - IEEE Instrumentation and Measurement Technology Conference

Volumn 2, Issue , 2004, Pages 823-828

  Serra, Antonio Cruz ^a   Da Silva, Manuel Fonseca ^a   Ramos, Pedro ^a   Michaeli, Linus ^b   Šaliga, Jan ^b  

^a INSTITUTO DE TELECOMUNICAÇÕES   (Portugal)

^b TECHNICAL UNIVERSITY OF KO ICE   (Slovakia)

Author keywords

ADC Modeling; ADC Testing; Sine fitting

Indexed keywords

ALGORITHMS; CODE CONVERTERS; DIGITAL TO ANALOG CONVERSION; FUNCTIONS; IMAGE ANALYSIS; MATHEMATICAL MODELS; POLYNOMIAL APPROXIMATION; SIGNAL PROCESSING;

ADC MODELING; ADC TESTING; HIGH CODE FREQUENCY (HCF); LODE CODE FREQUENCY (LCF); SINE FITTING;

ANALOG TO DIGITAL CONVERSION;

EID: 4644243883     PISSN: 10915281     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (6)

1. Michaeli, L., Michalko, P.,Šaliga,J.: "Identification of ADC Error Model by Testing of the Chosen Code Bins", Proc.of 12th IMEKO TC4 International Symposium September 25-27, 2002, Zagreb, Croatia.
2. Arpaia P., Serra,A.Cruz., Daponte, P.,:Monteiro,C.L..: "A Critical Note to IEEE 1057-94 Standard on Hysteric ADC Dynamic Testing", IEEE Trans.on Instrumentation and Measurement, Vol 50., No.4., Aug.2001 pp.941-947.
3. Alegria, F., Arpaia, P., Serra, A.Cruz, Daponte, P.,: "An ADC histogram test based on small-amplitude waves", Measurement, Vol.27 (2001), No.4, ISSN 0263-2241
4. Arpaia P., Daponte, P., Michaeli, L.: "The influence of the architecture on ADC modelling", IEEE Trans.on Instrumentation and Measurement, Vol 48., No.5., pp.956-967. October 1999, ISSN 0018-9456
5. "IEEE 1057 Standard for digitizing waveform recorders", SH94245, December, 1994.
6. Silva, M., Ramos, P., Serra, A. Cruz: "Least-squares Fitting Algorithms Applied to Periodic Signals", accepted for publication in IMTC2004.