X-ray spectroscopy of hollow argon atoms formed on a beryllium surface

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 245, Issue 1, 2006, Pages 72-75

  Zhao, Yongtao ^a   Xiao, Guoqing ^a   Zhang, Xiaoan ^a   Yang, Zhihu ^a   Zhan, Wenlong ^a   Chen, Ximeng ^b   Li, Fuli ^c  

^a INSTITUTE OF MODERN PHYSICS   (China)

^b LANZHOU UNIVERSITY   (China)

^c XI'AN JIAOTONG UNIVERSITY   (China)

Author keywords

Highly charged ion (HCI); Hollow atom (HA); X rays

Indexed keywords

ARGON; BERYLLIUM; HYDROGEN; IONS; SURFACE PROPERTIES; X RAYS;

HIGHLY CHARGED ION (HCI); HOLLOW ATOM (HA); HYDROGEN-LIKE ARGON IONS;

X RAY SPECTROSCOPY;

EID: 33344458264     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2005.11.081     Document Type: Conference Paper

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