Signal processing for a single detector MOEMS based NIR micro spectrometer

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5964, Issue , 2005, Pages

  Heberer, Andreas ^a   Grüger, Heinrich ^a   Zimmer, Fabian ^a   Schenk, Harald ^a   Kenda, Andreas ^a   Frank, Albert ^a   Scherf, Werner ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

DIFFRACTION GRATINGS; INFRARED DETECTORS; INFRARED SPECTROMETERS; PHOTODIODES; PROCESS CONTROL; SCANNING;

INGAAS PHOTODIODES; MONOCHROME INTENSITY; SIGNAL AMPLIFICATION; TRANSIMPEDANCE STAGES;

SIGNAL PROCESSING;

EID: 33144488047     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.624990     Document Type: Conference Paper

References (9)

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3. H. Grüger, A. Wolter, T. Schuster, H. Schenk, H. Lakner "Realization of a spectrometer with micromachined scanning grating" SPIE Proceedings Photonics Fabrication Europe, Brugge/B 2002,4945_6
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6. H. Grüger, A. Heberer, F. Zimmer, A. Wolter, H. Schenk "Miniaturized MOEMS spectrometer for NIR applications" SPIE Proceedings Optics & Photonics 2005, San Diego/USA, 5877_20
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