-
1
-
-
84875113464
-
Fabrication of native single-crystal AlN substrate
-
vol. 0
-
L. J. Schowalter, G. A. Slack, J. B. Whitlock, K. Morgan, S. B. Schujman, B. Raghothamachar, M. Dudley, and K. R. Evans, "Fabrication of native single-crystal AlN substrate," Phys. Stat. Sol. (c), vol. 0, pp. 1997-2000, 2003.
-
(2003)
Phys. Stat. Sol. (C)
, pp. 1997-2000
-
-
Schowalter, L.J.1
Slack, G.A.2
Whitlock, J.B.3
Morgan, K.4
Schujman, S.B.5
Raghothamachar, B.6
Dudley, M.7
Evans, K.R.8
-
2
-
-
0038734407
-
Temperature coefficient of SAW frequency in single crystal bulk AlN
-
May
-
G. Bu, D. Čiplys, M. Shur, L. J. Schowalter, S. Schujman, and R. Gaska, "Temperature coefficient of SAW frequency in single crystal bulk AlN," Electron. Lett., vol. 398, pp. 755-757, May 2003.
-
(2003)
Electron. Lett.
, vol.398
, pp. 755-757
-
-
Bu, G.1
Čiplys, D.2
Shur, M.3
Schowalter, L.J.4
Schujman, S.5
Gaska, R.6
-
3
-
-
0004138817
-
-
W. P. Mason and R. N. Thurston, Eds. New York: Academic
-
G. W. Farnell and E. L. Adler, Physical Acoustics, vol. 9, W. P. Mason and R. N. Thurston, Eds. New York: Academic, 1972.
-
(1972)
Physical Acoustics
, vol.9
-
-
Farnell, G.W.1
Adler, E.L.2
-
4
-
-
35949004800
-
Electronic structure and properties of AlN
-
Mar.
-
E. Ruiz, S. Alvarez, and P. Alemany, "Electronic structure and properties of AlN," Phys. Rev. B, vol. 49, pp. 7115-7123, Mar. 1994.
-
(1994)
Phys. Rev. B
, vol.49
, pp. 7115-7123
-
-
Ruiz, E.1
Alvarez, S.2
Alemany, P.3
-
5
-
-
0001340020
-
First-principles study on electronic and elastic properties of BN, AlN, and GaN
-
Nov.
-
K. Shimada, T. Sota, and K. Suzuki, "First-principles study on electronic and elastic properties of BN, AlN, and GaN," J. Appl. Phys., vol. 84, pp. 4951-4958, Nov. 1998.
-
(1998)
J. Appl. Phys.
, vol.84
, pp. 4951-4958
-
-
Shimada, K.1
Sota, T.2
Suzuki, K.3
-
6
-
-
0001495657
-
Elastic properties of zinc-blende and wurtzite AlN, GaN, and InN
-
Sep.
-
A. F. Wright, "Elastic properties of zinc-blende and wurtzite AlN, GaN, and InN," J. Appl. Phys., vol. 82, pp. 2833-2839, Sep. 1997.
-
(1997)
J. Appl. Phys.
, vol.82
, pp. 2833-2839
-
-
Wright, A.F.1
-
7
-
-
0028499134
-
First-principles calculation of the elastic stiffness tensor of aluminium nitride under high pressure
-
R. Kato and J. Hama, "First-principles calculation of the elastic stiffness tensor of aluminium nitride under high pressure," J. Phys. Condena. Matter, vol. 6, pp. 7617-7632, Sep. 1994.
-
(1994)
J. Phys. Condena. Matter
, vol.6
, pp. 7617-7632
-
-
Kato, R.1
Hama, J.2
-
8
-
-
0000400597
-
Elastic constants and related properties of tetrahedrally bonded BN, AlN, GaN, and InN
-
June
-
K. Kim, W. R. L. Hambrecht, and B. Segall, "Elastic constants and related properties of tetrahedrally bonded BN, AlN, GaN, and InN," Phys. Rev. B, vol. 53, pp. 16310-16326, June 1996.
-
(1996)
Phys. Rev. B
, vol.53
, pp. 16310-16326
-
-
Kim, K.1
Hambrecht, W.R.L.2
Segall, B.3
-
9
-
-
0036404957
-
Evaluation of physical parameters for the group III nitrates: BN, AlN, GaN, and InN
-
Jan.
-
S. Y. Davydov, "Evaluation of physical parameters for the group III nitrates: BN, AlN, GaN, and InN," Semiconductors, vol. 36, pp. 41-44, Jan. 2002.
-
(2002)
Semiconductors
, vol.36
, pp. 41-44
-
-
Davydov, S.Y.1
-
10
-
-
7744225077
-
Vibrational spectroscopy of aluminum nitride
-
May
-
L. E. McNeil, M. Grimsditch, and R. H. French, "Vibrational spectroscopy of aluminum nitride," J. Amer. Ceram. Soc., vol. 76, pp. 1132-1136, May 1993.
-
(1993)
J. Amer. Ceram. Soc.
, vol.76
, pp. 1132-1136
-
-
McNeil, L.E.1
Grimsditch, M.2
French, R.H.3
-
11
-
-
0000939713
-
1-xN thin films obtained by surface acoustic-wave measurements
-
May
-
1-xN thin films obtained by surface acoustic-wave measurements, " Appl. Phys. Lett., vol. 72, pp. 2400-2402, May 1998.
-
(1998)
Appl. Phys. Lett.
, vol.72
, pp. 2400-2402
-
-
Deger, C.1
Born, E.2
Angerer, H.3
Ambacher, O.4
Stutzmann, M.5
Hormsteiner, J.6
Riha, E.7
Fischerauer, G.8
-
13
-
-
0029459174
-
The elastic constants of sputtered aluminum nitride films
-
G. Carlotti, F. S. Hickernell, H. M. Liaw, L. Palmieri, G. Socino, and E. Verona, "The elastic constants of sputtered aluminum nitride films," in Proc. IEEE Ultrason. Symp., 1995, pp. 353-356.
-
(1995)
Proc. IEEE Ultrason. Symp.
, pp. 353-356
-
-
Carlotti, G.1
Hickernell, F.S.2
Liaw, H.M.3
Palmieri, L.4
Socino, G.5
Verona, E.6
-
14
-
-
0032442840
-
X-ray and single crystal values of the elastic constants and determination of machining residual stresses in AlN
-
A. Kampfe, B. Eigenmann, O. Vohringer, and D. Lohe, "X-ray and single crystal values of the elastic constants and determination of machining residual stresses in AlN," High Temperature Material Processes, vol. 2, pp. 309-326, 1998.
-
(1998)
High Temperature Material Processes
, vol.2
, pp. 309-326
-
-
Kampfe, A.1
Eigenmann, B.2
Vohringer, O.3
Lohe, D.4
-
15
-
-
3042587716
-
Electromechanical coupling coefficient for surface acoustic waves in single crystal, bulk aluminum nitride
-
June
-
G. Bu, D. Čiplys, M. Shur, L. J. Schowalter, S. Schujman, and R. Gaska, "Electromechanical coupling coefficient for surface acoustic waves in single crystal, bulk aluminum nitride," Appl. Phys. Lett., vol. 84, pp. 4611-4613, June 2004.
-
(2004)
Appl. Phys. Lett.
, vol.84
, pp. 4611-4613
-
-
Bu, G.1
Čiplys, D.2
Shur, M.3
Schowalter, L.J.4
Schujman, S.5
Gaska, R.6
-
16
-
-
0014438173
-
Dielectric properties of reactively sputtered films of aluminum nitride
-
Jan.
-
A. J. Noreika, M. H. Prancombe, and S. A. Zeitman, "Dielectric properties of reactively sputtered films of aluminum nitride," J. Vac. Sci. Technol., vol. 6, pp. 194-197, Jan. 1969.
-
(1969)
J. Vac. Sci. Technol.
, vol.6
, pp. 194-197
-
-
Noreika, A.J.1
Prancombe, M.H.2
Zeitman, S.A.3
-
17
-
-
13144259759
-
Growth of high purity AlN crystals
-
July
-
G. A. Slack and T. F. McNelly, "Growth of high purity AlN crystals," J. Crystal Growth, vol. 34, pp. 263-279, July 1976.
-
(1976)
J. Crystal Growth
, vol.34
, pp. 263-279
-
-
Slack, G.A.1
McNelly, T.F.2
-
18
-
-
0014595923
-
Analysis of interdigital surface wave transducers by use of an equivalent circuit model
-
Nov.
-
R. Smith, H. M. Gerard, J. H. Collins, T. M. Reeder, and H. J. Shaw, "Analysis of interdigital surface wave transducers by use of an equivalent circuit model," IEEE Trans. Microwave Theory Tech., vol. MTT-17, pp. 856-864, Nov. 1969.
-
(1969)
IEEE Trans. Microwave Theory Tech.
, vol.MTT-17
, pp. 856-864
-
-
Smith, R.1
Gerard, H.M.2
Collins, J.H.3
Reeder, T.M.4
Shaw, H.J.5
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