Introduction and characterization of interfacial defects in SrRuO3/BaTiO3/SrRuO3 multilayer films

Journal of Crystal Growth

Volumn 247, Issue 3-4, 2003, Pages 381-386

  Jia, C L ^a   Rodriguez Contreras J ^a   Schubert, J ^a   Lentzen, M ^a   Poppe, U ^a   Kohlstedt, H ^a   Urban, K ^a   Waser, R ^a  

^a FORSCHUNGSZENTRUM JÜLICH   (Germany)

Author keywords

A1. High resolution transmission electron microscopy; A1. Interfaces; A1. Ruddlesden Popper type planar fault; A1. SrRuO3 BaTiO3 heterofilm; B1. Perovskites

Indexed keywords

BARIUM TITANATE; CRYSTAL DEFECTS; HIGH RESOLUTION ELECTRON MICROSCOPY; INTERFACES (MATERIALS); STRAIN; STRONTIUM COMPOUNDS; TRANSMISSION ELECTRON MICROSCOPY;

MULTILAYER FILMS;

THIN FILMS;

EID: 0037212606     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0248(02)01985-1     Document Type: Article

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