Capacitance of a molecular overlayer on the silicon surface measured by scanning tunneling microscopy

Physical Review B - Condensed Matter and Materials Physics

Volumn 62, Issue 3, 2000, Pages 2034-2038

  Akiyama, Ryota ^a   Matsumoto, Takuya ^a   Kawai, Tomoji ^a  

^a OSAKA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000746880     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.62.2034     Document Type: Article

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