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Volumn 13, Issue 3, 2004, Pages 416-418

The mechanical behavior of Sn-Ag4 solder joints subjected to thermal cycling

Author keywords

Sn Ag4 solder; Solder joint; Stress strain hysteresis loops; Thermal cycling

Indexed keywords

BINDING ENERGY; COPPER; CRACKS; CRYSTAL LATTICES; DEGRADATION; DIFFUSION; ELASTIC MODULI; FINITE ELEMENT METHOD; HYSTERESIS; STRAIN GAGES; STRESS ANALYSIS; THERMAL CYCLING;

EID: 3242891794     PISSN: 10224653     EISSN: 20755597     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (2)

References (9)
  • 1
    • 0033881999 scopus 로고    scopus 로고
    • Alternative approach for the analysis of intermetallic compounds in SMT solder joints
    • I.K. Hui, H.W. Law, "Alternative approach for the analysis of intermetallic compounds in SMT solder joints", Soldering and Surface Mount Technology, Vol.12, No.1, pp.23-31, 2000.
    • (2000) Soldering and Surface Mount Technology , vol.12 , Issue.1 , pp. 23-31
    • Hui, I.K.1    Law, H.W.2
  • 2
    • 0035302273 scopus 로고    scopus 로고
    • Experimental damage mechanics of microelectronics solder joints under concurrent vibration and thermal loading
    • Apr.
    • C. Basaran, A. Cartwright, Y. Zhao, "Experimental damage mechanics of microelectronics solder joints under concurrent vibration and thermal loading", International Journal of Damage Mechanics, Vol.10, No.2, pp.153-170, Apr. 2001.
    • (2001) International Journal of Damage Mechanics , vol.10 , Issue.2 , pp. 153-170
    • Basaran, C.1    Cartwright, A.2    Zhao, Y.3
  • 3
    • 0034224822 scopus 로고    scopus 로고
    • Solder joint fatigue life of fine pitch BGAs-impact of design and material choices
    • Robert Darveaux, Jim Heckman, Ahmer Syed, Andrew Mawer, "Solder joint fatigue life of fine pitch BGAs-impact of design and material choices", Microelectronics Reliability, Vol.40, pp.1117-1127, 2000.
    • (2000) Microelectronics Reliability , vol.40 , pp. 1117-1127
    • Darveaux, R.1    Heckman, J.2    Syed, A.3    Mawer, A.4
  • 4
    • 0034273667 scopus 로고    scopus 로고
    • Reliability and failure analyses of thermally cycled ball grid array assemblies
    • Sept.
    • Reza Ghaffarian, Namsoo P. Kim, "Reliability and Failure Analyses of Thermally Cycled Ball Grid Array Assemblies", IEEE Transactions on Components and Packaging Technology, Vol.23, No.3, pp.528-534, Sept. 2000.
    • (2000) IEEE Transactions on Components and Packaging Technology , vol.23 , Issue.3 , pp. 528-534
    • Ghaffarian, R.1    Kim, N.P.2
  • 6
    • 84991432916 scopus 로고
    • Measurement of mechanical behavior of high lead lead-tin solder joints subjected to thermal cycling
    • Yi-Hsin Pao, Scott Badgley, Ratan Govila, et al., "Measurement of mechanical behavior of high lead lead-tin solder joints subjected to thermal cycling", Journal of Electronic Packaging, Vol.114, No.2, pp.136-144, 1992.
    • (1992) Journal of Electronic Packaging , vol.114 , Issue.2 , pp. 136-144
    • Pao, Y.-H.1    Badgley, S.2    Govila, R.3
  • 7
    • 3242889320 scopus 로고    scopus 로고
    • Stress-strain behavior of solder joints subjected to thermal cycling
    • Tsinghua University
    • Chen Guohai, "Stress-strain behavior of solder joints subjected to thermal cycling", Bachelor Thesis, Tsinghua University, pp.20-23, 2000.
    • (2000) Bachelor Thesis , pp. 20-23
    • Guohai, C.1
  • 8
    • 0027558439 scopus 로고
    • An experimental and finite element study of thermal fatigue fracture of PbSn solder joints
    • Yi-Hsin Pao, Ratan Govila, Scott Badgley, Edward Jih, "An experimental and finite element study of thermal fatigue fracture of PbSn solder joints", Journal of Electronic Packaging, Vol.115, No.1, pp.1-8, 1993.
    • (1993) Journal of Electronic Packaging , vol.115 , Issue.1 , pp. 1-8
    • Pao, Y.-H.1    Govila, R.2    Badgley, S.3    Jih, E.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.