SCOPUS 정보 검색 플랫폼

X-Ray Spectrometry

Volumn 33, Issue 4, 2004, Pages 281-284

Characterization of x-rays emerging from between reflector and sample carrier in reflector-assisted TXRF analysis

(2) Tsuji, Kouichi a Delalieux, Filip a

a Osaka Prefecture University (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

REFLECTION; X RAY DETECTORS;

COMPTON; FLUORESCENCE SIGNALS; HIGH INTENSITY; SI SURFACES; SI-DRIFT DETECTORS; TOTAL REFLECTION X-RAY FLUORESCENCE; TOTAL REFLECTION X-RAY FLUORESCENCE ANALYSIS; X RAY FLUORESCENCE; X RAY SPECTRUM; X-RAY BEAM;

FLUORESCENCE;

EID: 3242887336 PISSN: 00498246 EISSN: None Source Type: Journal
DOI: 10.1002/xrs.722 Document Type: Conference Paper

Times cited : (6)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.