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Spectrochimica Acta - Part B Atomic Spectroscopy

Volumn 52, Issue 7, 1997, Pages 841-846

Development of glancing-incidence and glancing-take-off X-ray fluorescence apparatus for surface and thin-film analyses

(5) Tsuji, Kouichi a Wagatsuma, Kazuaki a Hirokawa, Kichinosuke b Yamada, Takashi c Utaka, Tadashi c

a TOHOKU UNIVERSITY (Japan)

b ULVAC PHI Inc (Japan)

c Rigaku Denki Corporation (Japan)

Author keywords

Surface analysis; Surface density; Total reflection; X ray fluorescence

Indexed keywords

ELECTROMAGNETIC WAVE DIFFRACTION; ELECTROMAGNETIC WAVE REFLECTION; FLUORESCENCE; SURFACE STRUCTURE; THIN FILMS;

GLANCING INCIDENCE X RAY FLUORESCENCE; GLANCING TAKE OFF X RAY FLUORESCENCE; RECIPROCITY THEOREM; SURFACE ANALYSIS;

X RAY ANALYSIS;

EID: 0031162721 PISSN: 05848547 EISSN: None Source Type: Journal
DOI: 10.1016/S0584-8547(96)01667-9 Document Type: Article

Times cited : (15)

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