Strain analysis in ultrathin silicide layers in Fe/CsCl- 57FeSi/Fe sandwiches

Applied Physics Letters

Volumn 85, Issue 2, 2004, Pages 200-202

  Croonenborghs, B ^a   Almeida, F M ^a   Cottenier, S ^a   Rots, M ^a   Vantomme, A ^a   Meersschaut, J ^a  

^a KU LEUVEN   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

CALIBRATION; EPITAXIAL GROWTH; IRON; LATTICE CONSTANTS; MOSSBAUER SPECTROSCOPY; QUARTZ; STRAIN; X RAY DIFFRACTION;

MONOSILICIDE FILMS; SILICIDE LATTICES; TETRAGONAL DISTORTIONS;

THIN FILMS;

EID: 3242881899     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1768307     Document Type: Article

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