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Volumn 59, Issue 5, 1999, Pages 3675-3687

Microscopic environment of fe in epitaxially stabilized (formula presented)

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Indexed keywords


EID: 0000747890     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.59.3675     Document Type: Article
Times cited : (38)

References (56)
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    • J. Dekoster, A. Vantomme, S. Degroote, R. Moons, and G. Langouche, in Structure and Properties of Multilayered Thin Films, edited by T. D. Nguyen, B. M. Lairson, B. M. Clemens, K. Sato, and S-C. Shin, MRS Symposia Proceedings No. 382 (Materials Research Society, Pittsburgh, 1995), p. 253.
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    • V. I. Goldanskii and R. H. Herber, (Academic, London, 1968)
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    • K. Syassen, R. A. Stradling, and A. R. Goñi, and, in, Proceedings of The Seventh International Conference on High Pressure Semiconductor Physics, HPSP-VII, July 28–31, 1996, Schwäbisch-Gmünd, Germany, edited by
    • N. E. Christensen, I. Wenneker, A. Svane, and M. Fanciulli, in Electronic Structures of Semiconductors under Pressure, Proceedings of The Seventh International Conference on High Pressure Semiconductor Physics, HPSP-VII, July 28–31, 1996, Schwäbisch-Gmünd, Germany, edited by K. Syassen, R. A. Stradling, and A. R. Goñi [Phys. Status Solidi B198, 23 (1996)].
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    • Christensen, N.E.1    Wenneker, I.2    Svane, A.3    Fanciulli, M.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.