Low frequency capacitance characterization of α-phase nickel phthalocyanine/lead interfaces: Effects of temperature and oxygen doping

Journal of Physics and Chemistry of Solids

Volumn 65, Issue 7, 2004, Pages 1345-1348

  Anthopoulos, Thomas D ^a,b   Shafai, Torfeh S ^b  

^a PHILIPS RESEARCH LABORATORIES   (Netherlands)

^b STAFFORDSHIRE UNIVERSITY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; CARRIER CONCENTRATION; ELECTRIC POTENTIAL; HEAT CONDUCTION; LIGHT EMITTING DIODES; NUMERICAL METHODS; OXYGEN; PHOTOVOLTAIC CELLS; SEMICONDUCTOR DOPING; SPECTROSCOPY; THERMAL EFFECTS;

BAND GAP; BARRIER DEPLETION LAYER; CAPACITANCE-VOLTAGE (C-V);

NICKEL COMPOUNDS;

EID: 3242726809     PISSN: 00223697     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jpcs.2004.03.004     Document Type: Article

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