Model-based overlapping clustering

Proceedings of the ACM SIGKDD International Conference on Knowledge Discovery and Data Mining

Volumn , Issue , 2005, Pages 532-537

  Banerjee, Arindam ^a   Krumpelman, Chase ^a   Ghosh, Joydeep ^a   Basu, Sugato ^b   Mooney, Raymond J ^b  

^a The University of Texas at Austin   (United States)

^b University of Texas at Austin   (United States)

Author keywords

Bregman divergences; Exponential model; Graphical model; High dimensional clustering; Overlapping clustering

Indexed keywords

ALGORITHMS; BIOTECHNOLOGY; GRAPHIC METHODS;

BREGMAN DIVERGENCES; EXPONENTIAL MODEL; GRAPHICAL MODEL; HIGH-DIMENSIONAL MODELING; OVERLAPPING CLUSTERING;

DATABASE SYSTEMS;

EID: 32344441237     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/1081870.1081932     Document Type: Conference Paper

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