InAs nano-dot array formation using nano-jet probe for photonics applications

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 44, Issue 7 B, 2005, Pages 5777-5780

  Ohkouchi, Shunsuke ^a,b   Nakamura, Yusui ^a,c   Nakamura, Hitoshi ^a   Asakawa, Kiyoshi ^a,d  

^a WASEDA UNIVERSITY   (Japan)

^b NEC CORPORATION   (Japan)

^c KUMAMOTO UNIVERSITY   (Japan)

^d UNIVERSITY OF TSUKUBA   (Japan)

Author keywords

Atomic force microscope; In; InAs; Molecular beam epitaxy; Quantum dot

Indexed keywords

ARRAYS; ATOMIC FORCE MICROSCOPY; MOLECULAR BEAM EPITAXY; PROBES; SEMICONDUCTING INDIUM COMPOUNDS; VOLTAGE CONTROL;

INAS; QUANTUM COMMUNICATION; QUANTUM COMPUTERS; VOLTAGE PULSE;

SEMICONDUCTOR QUANTUM DOTS;

EID: 31844442046     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.44.5777     Document Type: Article

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