Fowler-Nordheim tunnelling in Au-TiO2-Ag film structures

Central European Journal of Physics

Volumn 2, Issue 1, 2004, Pages 147-159

  Aarik, J ^a   Bichevin, V ^a   Jogi I ^a   Kaambre H ^a   Laan, M ^a   Sammelselg, V ^a  

^a UNIVERSITY OF TARTU   (Estonia)

Author keywords

Electrical properties; Fowler Nordheim plots; Thin films; Titanium dioxide; Tunnelling currents

Indexed keywords

EID: 31744442899     PISSN: 16443608     EISSN: 16443608     Source Type: Journal    
DOI: 10.2478/BF02476278     Document Type: Article

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