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Thin Solid Films

Volumn 500, Issue 1-2, 2006, Pages 252-258

Ellipsometry study of poly(o-methoxyaniline) thin films

(3) Shrestha, R P a Yang, D a Irene, E A a

a University of North Carolina at Chapel Hill (United States)

Author keywords

AFM; Ellipsometry; Optical properties; Poly(o methoxyaniline); POMA; Thin film

Indexed keywords

ANISOTROPY; ELLIPSOMETRY; INTERFACIAL ENERGY; ORGANIC POLYMERS; SPIN COATING; SURFACE ROUGHNESS; ULTRAVIOLET SPECTROSCOPY;

OPTICAL ANISOTROPY; SPECTROSCOPIC ELLIPSOMETRY (SE);

THIN FILMS;

EID: 31644439535 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/j.tsf.2005.11.084 Document Type: Article

Times cited : (14)

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