Spectroscopic ellipsometry for characterization of organic semiconductor polymeric thin films

Synthetic Metals

Volumn 138, Issue 1-2, 2003, Pages 49-53

  Losurdo, M ^a   Giangregorio, M M ^a   Capezzuto, P ^a   Bruno, G ^a   Babudri, F ^b   Colangiuli, D ^b   Farinola, G M ^b   Naso, F ^b  

^a CNR   (Italy)

^b UNIVERSITY OF BARI   (Italy)

Author keywords

Conjugated polymers; Optical properties; Organic polymeric films; Spectroscopic ellipsometry

Indexed keywords

DEPOSITION; ELLIPSOMETRY; FIELD EFFECT TRANSISTORS; LIGHT ABSORPTION; LIGHT EMITTING DIODES; MICROSTRUCTURE; OPTICAL CORRELATION; POLYMERIZATION; REFRACTIVE INDEX; SPECTROSCOPIC ANALYSIS; SPIN COATING; SYNTHESIS (CHEMICAL); THIN FILMS;

LINEAR CONJUGATED SYSTEMS (LCS);

SEMICONDUCTING POLYMERS;

EID: 0037902167     PISSN: 03796779     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0379-6779(02)01262-6     Document Type: Conference Paper

References (10)

1. Kraft A., Grimsdale A.C., Holmes A.B. Angew. Chem. Int. Ed. 37:1998;402.
2. Yu G., Gao J., Hummelen J.C., Wudl F., Heeger A.J. Science. 270:1995;1789.
3. Schön J.H., Dodabalapur A., Kloc Ch., Batlogg B. Science. 290:2000;963.
4. Brown A.R., Pomp A., Hart C.M., de Leeuw D.M. Science. 270:1995;972.
5. Garnier F., Hajlaoui R., Yassar A., Srivastava P. Science. 265:1994;1684.
6. Greenham N.C., Friend R.H., Bradley D.D.C. Adv. Mater. 6:1994;491.
7. F. Babudri, D. Colangiuli, G.M. Farinola, F. Naso, Eur. J. Org. Chem. (2002) 2785.
8. Bruggeman D.A.G. Ann. Phys. (Leipzig). 24:1935;636.
9. Graupner W., Grem G., Meghdadi F., Paar Ch., Leising G., Scherf U., Müllen K., Fischer W., Stelzer F. Mol. Cryst. Liq. Cryst. 256:1994;549.
10. Ambrosh-Draxl C., Majewski J.A., Vogl P., Leising G. Phys. Rev. B. 51:1995;9668.