Spectroscopic ellipsometry measurements on an anisotropic organic crystal: Potassium acid phtalate

Thin Solid Films

Volumn 313-314, Issue , 1998, Pages 347-350

  Sassella, A ^a   Tubino, R ^a   Borghesi, A ^a   Giardini, M E ^b   Quadrelli, L ^b  

^a UNIVERSITY OF MILAN   (Italy)

^b UNIVERSITY OF PAVIA   (Italy)

Author keywords

Anisotropic crystals; Extraordinary refractive index; Ordinary refractive index; Potassium acid phtalate; Spectroscopic ellipsometry

Indexed keywords

ANISOTROPY; CRYSTAL ORIENTATION; DEPOSITION; ELLIPSOMETRY; EPITAXIAL GROWTH; POLYMERS; POTASSIUM COMPOUNDS; REFRACTIVE INDEX; SPECTROSCOPIC ANALYSIS; SUBSTRATES;

POTASSIUM ACID PHTHALATE; SPECTROSCOPIC ELLIPSOMETRY;

OPTICAL FILMS;

EID: 0031997481     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(97)00844-4     Document Type: Article

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