Scanning tunneling microscopy observation of graphite surfaces irradiated with size-selected Ar cluster ion beams

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 44, Issue 8, 2005, Pages 6252-6254

  Houzumi, Shingo ^a   Mochiji, Kozo ^a   Toyoda, Noriaki ^a   Yamada, Isao ^a  

^a UNIVERSITY OF HYOGO   (Japan)

Author keywords

Cluster ion; Cluster size; Scanning tunneling microscopy; Size selection

Indexed keywords

ION BEAMS; IONS; KINETIC ENERGY; MAGNETIC FIELD EFFECTS; PERMANENT MAGNETS; SCANNING TUNNELING MICROSCOPY;

CLUSTER IONS; CLUSTER SIZE; SIZE SELECTION;

GRAPHITE;

EID: 31644434618     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.44.6252     Document Type: Article

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