Threshold voltage as a measure of molecular level shift in organic thin-film transistors

Applied Physics Letters

Volumn 88, Issue 4, 2006, Pages 1-3

  Tal, Oren ^a   Rosenwaks, Yossi ^a   Roichman, Yohai ^b   Preezant, Yevgeni ^b   Tessler, Nir ^b   Chan, Calvin K ^c   Kahn, Antoine ^c  

^a TEL AVIV UNIVERSITY   (Israel)

^b TECHNION ISRAEL INSTITUTE OF TECHNOLOGY   (Israel)

^c Princeton University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

KELVIN PROBE FORCE MICROSCOPY; MOLECULAR LEVEL SHIFT;

MICROSCOPIC EXAMINATION; THRESHOLD VOLTAGE;

THIN FILM TRANSISTORS;

EID: 31544458980     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2167395     Document Type: Article

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