Atomic structure of the σ3 and σ9 grain boundaries in CVD diamond film

Scripta Materialia

Volumn 51, Issue 7, 2004, Pages 689-692

  Sawada, Hidetaka ^a,c   Ichinose, Hideki ^a   Kohyama, Masanori ^b  

^a UNIVERSITY OF TOKYO   (Japan)

^b NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^c JEOL LTD   (Japan)

Author keywords

Atomic structure; Grain boundary; High resolution image; Transmission electron microscopy

Indexed keywords

CHEMICAL VAPOR DEPOSITION; CRYSTAL ATOMIC STRUCTURE; GRAIN BOUNDARIES; THICKNESS MEASUREMENT; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; VOLTAGE MEASUREMENT;

ATOMIC RESOLUTION HIGH VOLTAGE ELECTRON MICROSCOPE (ARHVTEM); ATOMIC STRUCTURES; HIGH-RESOLUTION IMAGES;

DIAMONDS;

EID: 3142768485     PISSN: 13596462     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.scriptamat.2004.06.011     Document Type: Article

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