Apparatus for real time in situ quantitative studies of growing nanoparticles by grazing incidence small angle X-ray scattering and surface differential reflectance spectroscopy

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 222, Issue 3-4, 2004, Pages 667-680

  Renaud, G ^a   Ducruet, M ^a   Ulrich, O ^a   Lazzari, R ^a,b  

^a CEA GRENOBLE   (France)

^b INSTITUT DES NANOSCIENCES DE PARIS   (France)

Author keywords

Buried dislocation network; GISAXS; In situ; Morphology; Nano particles; Self organized growth

Indexed keywords

ATOMIC FORCE MICROSCOPY; CHARGE COUPLED DEVICES; ELECTROMAGNETIC WAVE SCATTERING; ION BEAMS; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTOR QUANTUM DOTS; TRANSMISSION ELECTRON MICROSCOPY; ULTRAHIGH VACUUM; X RAY SCATTERING; X RAY SPECTROSCOPY;

BURIED DISLOCATION NETWORK; GRAZING INCIDENCE SMALL ANGLE X-RAY SCATTERING (GISAXS); IN SITU; SELF-ORGANIZED GROWTH;

NANOSTRUCTURED MATERIALS;

EID: 3142738146     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2004.04.158     Document Type: Article

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