In situ of a thin metal film by optical means

Applied Surface Science

Volumn 142, Issue 1, 1999, Pages 451-454

  Lazzari, R ^a   Jupille, J ^a   Borensztein, Y ^b  

^a CNRS   (France)

^b SORBONNE UNIVERSITÉ   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ASPECT RATIO; DEPOSITION; FILM GROWTH; MAGNESIA; MAGNETIC RELAXATION; MATHEMATICAL MODELS; MORPHOLOGY; REFLECTION; SILVER; SURFACE PHENOMENA; ULTRAVIOLET SPECTROSCOPY; VACUUM APPLICATIONS;

ELECTROMAGNETIC COUPLING; LOW INDEX SINGLE CRYSTAL SURFACES; SURFACE DIFFERENTIAL REFLECTANCE; VOLMER-WEBER TYPE;

METALLIC FILMS;

EID: 0032653193     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(98)00646-1     Document Type: Article

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