On the scaling limits of low-frequency noise in SiGe HBTs

Solid-State Electronics

Volumn 48, Issue 10-11 SPEC. ISS., 2004, Pages 1897-1900

  Johansen, Jarle A ^a   Jin, Zhenrong ^b   Cressler, John D ^b   Cui, Yan ^c   Niu, Guofu ^c   Liang, Qingqing ^b   Rieh, Jae Sung ^d   Freeman, Greg ^d   Ahlgren, Dave ^d   Joseph, Alvin ^d  

^a UNIVERSITY OF TROMSØ   (Norway)

^b GEORGIA INSTITUTE OF TECHNOLOGY   (United States)

^c AUBURN UNIVERSITY   (United States)

^d IBM MICROELECTRONICS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; COMMUNICATION SYSTEMS; COMPUTER SIMULATION; MATHEMATICAL MODELS; NATURAL FREQUENCIES; OPTIMIZATION; STATISTICAL METHODS; TRANSISTORS;

HIGH-SPEED TRANSISTORS; LOW-FREQUENCY NOISE; SCALING LIMITS; TIME CONSTANTS;

HETEROJUNCTION BIPOLAR TRANSISTORS;

EID: 3142718476     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.sse.2004.05.032     Document Type: Conference Paper

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