An approach to the built-in self-test of field programmable analog arrays

Proceedings of the IEEE VLSI Test Symposium

Volumn , Issue , 2004, Pages 383-388

  Balen, T ^a   Andrade Jr , A ^a   Azais F ^b   Lubaszewski, M ^a,c   Renovell, M ^b  

^a FEDERAL UNIVERSITY OF RIO GRANDE DO SUL   (Brazil)

^b LIRMM   (France)

^c UNIVERSITY OF SEVILLE   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

COMPLEX PROBLEMS; FIELD PROGRAMMABLE ANALOG ARRAYS (FPAA); PARAMETRIC FAULTS; TESTED COMPONENTS;

AUTOMATIC TESTING; COST EFFECTIVENESS; FUNCTIONS; OSCILLATIONS; PROBLEM SOLVING; SIGNAL THEORY;

FIELD PROGRAMMABLE GATE ARRAYS;

EID: 3142707417     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/VTEST.2004.1299268     Document Type: Conference Paper

References (9)

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