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Volumn 49, Issue 2, 2000, Pages 223-227

A new adaptive analog test and diagnosis system

Author keywords

Adaptive filters; Adaptive systems; Analog system fault diagnosis; Circuit testing; Testing

Indexed keywords

ADAPTIVE ALGORITHMS; ADAPTIVE SYSTEMS; DIGITAL FILTERS; FAILURE ANALYSIS; INTEGRATED CIRCUIT TESTING; MATHEMATICAL MODELS; OPERATIONAL AMPLIFIERS;

EID: 0033688755     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/19.843053     Document Type: Article
Times cited : (26)

References (12)
  • 1
    • 0029326967 scopus 로고
    • Multifrequency analysis of faults in analog circuits
    • Summer
    • M. Slamani and B. Kaminska, "Multifrequency analysis of faults in analog circuits," IEEE Design Test Comput., pp. 70-80, Summer 1995.
    • (1995) IEEE Design Test Comput. , pp. 70-80
    • Slamani, M.1    Kaminska, B.2
  • 3
    • 0030121249 scopus 로고    scopus 로고
    • Fault simulation for mixed-signal systems
    • Apr.
    • P. Caunegre and C. Abraham, "Fault simulation for mixed-signal systems," J. Electron. Testing: Theory Applicat., vol. 8, no. 2, pp. 143-152, Apr. 1996.
    • (1996) J. Electron. Testing: Theory Applicat. , vol.8 , Issue.2 , pp. 143-152
    • Caunegre, P.1    Abraham, C.2
  • 5
    • 0030206214 scopus 로고    scopus 로고
    • Fault-based ATPG for linear analog circuits with minimal size multifrequency test sets
    • Aug./Oct.
    • S. Mir, M. Lubaszewski, and B. Courtois, "Fault-based ATPG for linear analog circuits with minimal size multifrequency test sets," J. Electron. Testing: Theory Applicat., vol. 9, no. 1/2, pp. 43-57, Aug./Oct. 1996.
    • (1996) J. Electron. Testing: Theory Applicat. , vol.9 , Issue.1-2 , pp. 43-57
    • Mir, S.1    Lubaszewski, M.2    Courtois, B.3
  • 9
    • 0031623469 scopus 로고    scopus 로고
    • Efficient analog test methodology based on adaptive algorithms
    • Los Alamitos, CA: IEEE Computer Soc. Press, June
    • L. Carro and M. Negreiros, "Efficient analog test methodology based on adaptive algorithms," in Proc. ACM/IEEE Design Automation Conf.. Los Alamitos, CA: IEEE Computer Soc. Press, June 1998, pp. 32-37.
    • (1998) Proc. ACM/IEEE Design Automation Conf. , pp. 32-37
    • Carro, L.1    Negreiros, M.2
  • 11
    • 0011743871 scopus 로고    scopus 로고
    • Fault detection and classification in analog integrated circuits using Robust heteroscedastic probabilistic neural networks
    • June
    • Z. R. Yang, M. Z. Zwolinski, and C. D. Chalk, "Fault detection and classification in analog integrated circuits using Robust heteroscedastic probabilistic neural networks," in Proc. 4th Int. Mixed-Signal Testing Workshop, June 1998, pp. 41-46.
    • (1998) Proc. 4th Int. Mixed-Signal Testing Workshop , pp. 41-46
    • Yang, Z.R.1    Zwolinski, M.Z.2    Chalk, C.D.3
  • 12
    • 0031094371 scopus 로고    scopus 로고
    • Linear circuit fault diagnosis using neuromorphic analysers
    • Mar.
    • R. Spina and S. Upadhyaya, "Linear circuit fault diagnosis using neuromorphic analysers," IEEE Trans. Circuits Syst. II, vol. 44, pp. 188-196, Mar. 1997.
    • (1997) IEEE Trans. Circuits Syst. II , vol.44 , pp. 188-196
    • Spina, R.1    Upadhyaya, S.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.