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Volumn 48, Issue 10-11 SPEC. ISS., 2004, Pages 1917-1920
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A microstructural study of the CdTe/ZnTe film morphology as related to the Si substrate orientation
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Author keywords
CdTe; Molecular beam epitaxy (MBE); Si; Transmission electron microscopy (TEM)
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Indexed keywords
CRYSTAL DEFECTS;
DISLOCATIONS (CRYSTALS);
FILM GROWTH;
METALLIC FILMS;
MOLECULAR BEAM EPITAXY;
NUCLEATION;
PASSIVATION;
SEMICONDUCTING CADMIUM TELLURIDE;
SEMICONDUCTING ZINC COMPOUNDS;
SILICON;
SURFACE PHENOMENA;
TRANSMISSION ELECTRON MICROSCOPY;
TWINNING;
X RAY DIFFRACTION;
ANNIHILATION;
MIGRATION ENHANCED EPITAXY (MEE);
ULTRAHIGH VACUUM (UHV);
X RAY MEASUREMENTS;
SOLID STATE DEVICES;
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EID: 3142697972
PISSN: 00381101
EISSN: None
Source Type: Journal
DOI: 10.1016/j.sse.2004.05.036 Document Type: Conference Paper |
Times cited : (6)
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References (4)
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