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Volumn 48, Issue 10-11 SPEC. ISS., 2004, Pages 1917-1920

A microstructural study of the CdTe/ZnTe film morphology as related to the Si substrate orientation

Author keywords

CdTe; Molecular beam epitaxy (MBE); Si; Transmission electron microscopy (TEM)

Indexed keywords

CRYSTAL DEFECTS; DISLOCATIONS (CRYSTALS); FILM GROWTH; METALLIC FILMS; MOLECULAR BEAM EPITAXY; NUCLEATION; PASSIVATION; SEMICONDUCTING CADMIUM TELLURIDE; SEMICONDUCTING ZINC COMPOUNDS; SILICON; SURFACE PHENOMENA; TRANSMISSION ELECTRON MICROSCOPY; TWINNING; X RAY DIFFRACTION;

EID: 3142697972     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.sse.2004.05.036     Document Type: Conference Paper
Times cited : (6)

References (4)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.