Nucleation of ZnTe/CdTe epitaxy on high-Miller-index Si surfaces

Journal of Electronic Materials

Volumn 32, Issue 7, 2003, Pages 717-722

  Brill, G ^a   Chen, Y ^a   Dhar, N K ^a   Singh, R ^b  

^a U S ARMY RESEARCH LABORATORY   (United States)

^b EPIR TECHNOLOGIES INC   (United States)

Author keywords

Adsorption; CdTe; Molecular beam epitaxy (MBE); Nucleation; Si; X ray photoelectron spectroscopy (XPS)

Indexed keywords

MOLECULAR BEAM EPITAXY; NUCLEATION; SEMICONDUCTING CADMIUM TELLURIDE; SILICON; SURFACE PROPERTIES; X RAY PHOTOELECTRON SPECTROSCOPY;

SURFACE-STEP DENSITY;

ZINC COMPOUNDS;

EID: 0042768018     PISSN: 03615235     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11664-003-0058-6     Document Type: Conference Paper

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