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Volumn 89, Issue 28, 2002, Pages
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Direct Separation of Short Range Order in Intermixed Nanocrystalline and Amorphous Phases
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Author keywords
[No Author keywords available]
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Indexed keywords
AMORPHOUS MATERIALS;
ANNEALING;
ATOMS;
LATTICE CONSTANTS;
MAGNETRON SPUTTERING;
MOLECULAR STRUCTURE;
NANOSTRUCTURED MATERIALS;
PHOTONS;
SEPARATION;
SILICA;
SUBSTRATES;
X RAY DIFFRACTION ANALYSIS;
DIFFERENTIAL ANOMALOUS SCATTERING;
DIFFRACTION ANOMALOUS FINE-STRUCTURE;
EXTENDED X-RAY ABSORPTION FINE-STRUCTURE;
FIRST-SHELL DISTANCE DISTRIBUTION;
NANOCRYSTALLINE DISTANCE;
RADIO-FREQUENCY MAGNETRON SPUTTERING;
SHORT RANGE ORDER;
GERMANIUM;
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EID: 0037207385
PISSN: 00319007
EISSN: 10797114
Source Type: Journal
DOI: 10.1103/PhysRevLett.89.285503 Document Type: Article |
Times cited : (42)
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References (18)
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