Determination of the inelastic mean free paths (IMFPs) in Ti by elastic peak electron spectroscopy (EPES): Effect of impurities and surface excitations

Applied Surface Science

Volumn 252, Issue 8, 2006, Pages 2741-2746

  Lesiak, B ^a   Zemek, J ^b   Jiricek, P ^a,b  

^a INSTITUTE OF PHYSICAL CHEMISTRY   (Poland)

^b INSTITUTE OF PHYSICS   (Czech Republic)

Author keywords

Cu; Elastic peak electron spectroscopy; Electron elastic scattering cross sections; EPES; IMFP; Inelastic mean free path; Surface excitations; Ti

Indexed keywords

CONTAMINATION; HYDROGEN; IMPURITIES; SCATTERING; SURFACES;

ELASTIC PEAK ELECTRON SPECTROSCOPY (EPES); SURFACE EXCITATION;

ELECTRON SPECTROSCOPY;

EID: 31344442362     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2005.04.046     Document Type: Article

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