Development of a high-resolution x-ray imaging system with a charge-coupled-device detector coupled with crystal x-ray magnifiers

Review of Scientific Instruments

Volumn 71, Issue 12, 2000, Pages 4449-4456

  Sato, K ^b   Hasegawa, Y ^a,b   Kondo, K ^b   Miyazaki, K ^b   Matsushita, T ^c   Amemiya, Y ^b  

^a TU WIEN   (Austria)

^b UNIVERSITY OF TOKYO   (Japan)

^c INSTITUTE OF MATERIALS STRUCTURE SCIENCE   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001153144     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1322588     Document Type: Article

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