In situ study of multilayer reflectivity upon heat treatment under synchrotron radiation

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5918, Issue , 2005, Pages 1-10

  Borel, Christine ^a   Morawe, Christian ^a   Ziegler, Eric ^a   Bigault, Thierry ^b   Massonnat, Jean Yves ^a   Peffen, Jean Christophe ^a   Debourg, Emilie ^a  

^a EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^b INSTITUT LAUE LANGEVIN   (France)

Author keywords

Heat treatment; In situ reflectivity; Multilayers; Synchrotron radiation; X ray optics

Indexed keywords

COMPUTER SIMULATION; ELECTRON CYCLOTRON RESONANCE; HEAT TREATMENT; MAGNETS; PHOTONS; REFLECTION; SPUTTERING; SYNCHROTRON RADIATION; X RAY OPTICS;

IN SITU REFLECTIVITY; PHOTON ENERGY;

MULTILAYERS;

EID: 30944465921     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.613873     Document Type: Conference Paper

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