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Volumn 83, Issue 9, 1998, Pages 4700-4708

Temperature induced diffusion in Mo/Si multilayer mirrors

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0000690424     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.367258     Document Type: Article
Times cited : (40)

References (36)
  • 15
    • 85034285355 scopus 로고    scopus 로고
    • private communications
    • G. Ittner and Carl Zeiss (private communications).
    • Ittner, G.1    Zeiss, C.2
  • 17
    • 85034289962 scopus 로고    scopus 로고
    • note
    • The amplitude is defined as the square root of the increase of the reflectivity during deposition of a high-Z material, normalized to the square root of the reflectivity before the deposition of that layer.
  • 18
    • 85034307911 scopus 로고    scopus 로고
    • note
    • Nowadays, a 0.1% reproducibility is obtained because of hardware improvements in the in situ reflectometer.
  • 24
    • 85034297497 scopus 로고    scopus 로고
    • note
    • R. Koper of the Surface Preparation Laboratory at the FOM-Institute for Atomic and Molecular Physics, Amsterdam.
  • 27
    • 85034303967 scopus 로고    scopus 로고
    • note
    • The increase of the amplitude of the in situ reflectivity during the first 12 periods of the multilayer is caused by an increasing number of layers that contribute to the reflectivity.
  • 28
    • 85034308446 scopus 로고    scopus 로고
    • note
    • The results in Table II show an insignificant increase of the interface roughness of the 24- and 32-period samples compared to the 12-period sample, but this will hardly influence the amplitude of the in situ reflection between the 12th and 24th period.
  • 29
    • 0003250876 scopus 로고
    • E. Chason and T. M. Mayer, Appl. Phys. Lett. 62, 363 (1993); and E. Chason, T. M. Mayer, B. K. Kellerman, D. T. McIlroy, and A. J. Howard, Phys. Rev. Lett. 72, 3040 (1994).
    • (1993) Appl. Phys. Lett. , vol.62 , pp. 363
    • Chason, E.1    Mayer, T.M.2
  • 32
    • 0003988726 scopus 로고
    • edited by R. Balien, M. Kléman, and J.-P. Poirer, Les Houches Lectures XXXV North-Holland, Amsterdam
    • F. Spaepen, Physics of Defects, edited by R. Balien, M. Kléman, and J.-P. Poirer, Les Houches Lectures XXXV (North-Holland, Amsterdam, 1981), p. 136.
    • (1981) Physics of Defects , pp. 136
    • Spaepen, F.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.