Carbon window soft x-ray imaging using multilayer optics

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5919, Issue , 2005, Pages 1-10

  Artyukov, Igor A ^a   Bugayev, Yegor ^b   Devizenko, Oleksandr Yu ^b   Feschenko, Ruslan M ^a   Kasyanov, Yuri S ^c   Kondratenko, Valeri V ^b   Romanova, Svetlana A ^a   Saveliev, Sergei V ^d   Schäfers, Franz ^e   Feigl, Torsten ^f   Uspenski, Yuri A ^a   Vinogradov, Alexander V ^a  

^a LEBEDEV PHYSICAL INSTITUTE   (Russian Federation)

^b NATIONAL TECHNICAL UNIVERSITY   (Ukraine)

^c PROKHOROV GENERAL PHYSICS INSTITUTE   (Russian Federation)

^d RESEARCH INSTITUTE OF HUMAN MORPHOLOGY   (Russian Federation)

^e HAHN MEITNER INSTITUT   (Germany)

^f FRAUNHOFER INSTITUTE FOR APPLIED OPTICS AND PRECISION ENGINEERING   (Germany)

Author keywords

Soft x ray microscopy; SXM; X ray multilayer mirrors

Indexed keywords

CARBON FIBERS; GRAPHITE; IMAGING TECHNIQUES; NANOTECHNOLOGY; OPTICS; THIN FILMS;

SOFT X-RAY MICROSCOPY; SXM; X-RAY MULTILAYER MIRRORS;

X RAY ANALYSIS;

EID: 30844435725     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.620037     Document Type: Conference Paper

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