-
2
-
-
0346248062
-
-
F. Y. Yang, Kai Liu, Kimin Hong, D. H. Reich, P. C. Searson, C. L. Chien, Y. Leprince-Wang, Kui Yu Zhang, and Ke Han, Phys. Rev. B 61, 6631 (2000).
-
(2000)
Phys. Rev. B
, vol.61
, pp. 6631
-
-
Yang, F.Y.1
Kai, L.2
Kimin, H.3
Reich, D.H.4
Searson, P.C.5
Chien, C.L.6
Leprince-Wang, Y.7
Kui Yu, Z.8
Ke, H.9
-
4
-
-
0032614101
-
-
F. Y. Yang, K. Liu, C. L. Chien, and P. C. Searson, Phys. Rev. Lett. 82, 3328 (1999).
-
(1999)
Phys. Rev. Lett.
, vol.82
, pp. 3328
-
-
Yang, F.Y.1
Liu, K.2
Chien, C.L.3
Searson, P.C.4
-
6
-
-
0000271409
-
-
D. L. Partin, J. Heremans, D. T. Morelli, C. M. Thruth, C. H. Olk, and T. A. Perry, Phys. Rev. B 38, 3818 (1988).
-
(1988)
Phys. Rev. B
, vol.38
, pp. 3818
-
-
Partin, D.L.1
Heremans, J.2
Morelli, D.T.3
Thruth, C.M.4
Olk, C.H.5
Perry, T.A.6
-
7
-
-
0346222412
-
-
T. Van Gemmeren, L. Lottermoser, G. Falkenberg, O. Bunk, R. L. Johnson, R. Feidenhans'l, and M. Nielsen, Surf. Sci. 414, 254 (1998).
-
(1998)
Surf. Sci.
, vol.414
, pp. 254
-
-
Van Gemmeren, T.1
Lottermoser, L.2
Falkenberg, G.3
Bunk, O.4
Johnson, R.L.5
Feidenhans'l, R.6
Nielsen, M.7
-
8
-
-
0024768765
-
-
N. Esser, M. Hunermann, U. Resch, D. Spaltmann, J. Geurts, D. R. T. Zahn, W. Richter, and R. H. Williams, Appl. Surf. Sci. 41-42, 169 (1989).
-
(1989)
Appl. Surf. Sci.
, vol.41-42
, pp. 169
-
-
Esser, N.1
Hunermann, M.2
Resch, U.3
Spaltmann, D.4
Geurts, J.5
Zahn, D.R.T.6
Richter, W.7
Williams, R.H.8
-
9
-
-
0000369199
-
-
C. A. Hoffman, J. R. Meyer, F. J. Partolli, A. Di Venere, X. J. Yi, C. L. Hou, H. C. Wang, J. B. Ketterson, and G. K. Wong, Phys. Rev. B 48, 11 431 (1993).
-
(1993)
Phys. Rev. B
, vol.48
, pp. 11431
-
-
Hoffman, C.A.1
Meyer, J.R.2
Partolli, F.J.3
Di Venere, A.4
Yi, X.J.5
Hou, C.L.6
Wang, H.C.7
Ketterson, J.B.8
Wong, G.K.9
-
10
-
-
0012646864
-
-
0021-8979 10.1063/1.1323537
-
P. M. Vereecken, L. Sun, P. C. Searson, M. Tanase, D. H. Reigh, and C. L. Chien, J. Appl. Phys. 0021-8979 10.1063/1.1323537 88, 6529 (2000); P. M. Vereecken, K. Rodbell, C. Ji, and P. C. Searson, Appl. Phys. Lett. 86, 121916 (2005).
-
(2000)
J. Appl. Phys.
, vol.88
, pp. 6529
-
-
Vereecken, P.M.1
Sun, L.2
Searson, P.C.3
Tanase, M.4
Reigh, D.H.5
Chien, C.L.6
-
11
-
-
17944377179
-
-
P. M. Vereecken, L. Sun, P. C. Searson, M. Tanase, D. H. Reigh, and C. L. Chien, J. Appl. Phys. 0021-8979 10.1063/1.1323537 88, 6529 (2000); P. M. Vereecken, K. Rodbell, C. Ji, and P. C. Searson, Appl. Phys. Lett. 86, 121916 (2005).
-
(2005)
Appl. Phys. Lett.
, vol.86
, pp. 121916
-
-
Vereecken, P.M.1
Rodbell, K.2
Ji, C.3
Searson, P.C.4
-
15
-
-
0003598030
-
-
Butterworths, London
-
P. B. Hirsh, A. Howie, R. B. Nicholson, and D. W. Pashley, Electron Microscopy of Thin Crystals (Butterworths, London, 1965), p. 362.
-
(1965)
Electron Microscopy of Thin Crystals
, pp. 362
-
-
Hirsh, P.B.1
Howie, A.2
Nicholson, R.B.3
Pashley, D.W.4
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