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Volumn 864, Issue , 2005, Pages 253-258

Conductivity enhancement in thin silicon-on-insulator layer embedding artificial dislocation network

Author keywords

[No Author keywords available]

Indexed keywords

LATTICE CONSTANTS; SILICON; SILICON WAFERS; TRANSMISSION ELECTRON MICROSCOPY;

EID: 30644475276     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-864-e6.5     Document Type: Conference Paper
Times cited : (8)

References (7)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.