Synchrotron-based spectroscopy for the characterization of surfaces and interfaces in chalcopyrite solar cells

Materials Research Society Symposium Proceedings

Volumn 865, Issue , 2005, Pages 41-52

  Lauermann, Iver ^a   Pistor, Paul ^a   Kötschau, Immo ^a   Bär, Marcus ^a  

^a HAHN MEITNER INSTITUT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CHARACTERIZATION; COMPOSITION; EMISSION SPECTROSCOPY; INTERFACES (MATERIALS); PHOTOVOLTAIC CELLS; SURFACE TREATMENT; X RAY PHOTOELECTRON SPECTROSCOPY; SPECTROSCOPIC ANALYSIS;

PHOTOVOLTAIC DEVICES; SYNCHROTRON-BASED SPECTROSCOPY; BERLIN , GERMANY; BURIED INTERFACE; CHALCOPYRITE SOLAR CELLS; CHEMICAL DEPTH; SOFT X RAY EMISSION SPECTROSCOPY; SPECTROSCOPIC METHOD; SURFACES AND INTERFACES; THIN-FILM PHOTOVOLTAIC DEVICES;

SOLAR CELLS; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 30544447421     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-865-f2.1     Document Type: Conference Paper

References (49)

1. Durose, K. et al., Prog. Photovolt.: Res. Appl., 12, 177 (2004)
2. Einstein, A., Annalen der Physik, 17, 132 (1905)
3. Bubert, H. et al., eds. Surface and Thin Film Analysis. 2001, Wiley-VCH: Weinheim.
4. Scofield. J.H., J. Electron Spectrosc. Relat. Phenom., 8, 129 (1976)
5. Yeh, J.J. et al., Atomic Data and Nuclear Data Tables, 32, 1 (1985)
6. Reilmann, R.F. et al., J. Electron Spectrosc. Relat. Phenom., 8, 389 (1976)
7. Wagner. C.D. et al., Handbook of X-ray Photoelectron Spectroscopy. 1979, Minnesota: Perkin-Elmer Corporation.
8. NIST, NIST X-Ray Photoelectron Spectroscopy Database, NIST Standard Reference Database 20, Version 3.4, 2005, Internet:http://srdata.nist.gov/xps/
9. Briggs, D. et al., eds. Practical Surface Analysis. Vol. 1. 1990, John Wiley & Sons.
10. Feldmann, L.C. et al., Fundamentals of Surface and Thin Film Analysis. 1986: North-Holland.
11. Hüfher, S., Photoelectron Spectroscopy. 1995: Springer Verlag.
12. Schmid, D. et al., Sol. Energy Mater., 41/42, 281 (1996)
13. Canava, B. et at., Appl. Surf. Sci., 202, 8 (2002)
14. Ruckh, M. et al., J. Appl. Phys., 76(10), 5945 (1994)
15. Heske, C. et al., J. Appl. Phys., 82(5), 2411 (1997)
16. Cahen, D. et al., J. Appl. Phys., 57(10), 4761 (1984)
17. Kao, Y.H. in proc. of Photovoltaics for the 21st Century. 1999. Seattle: Electrochem. Soc. 153
18. Nelson, A.J. et al., Appl. Phys. Lett., 57(14), 1428 (1990)
19. Zurcher, P. et al. in proc. of 19th IEEE Photovoltaic Specialists Conference. 1987. New York, NY, USA. 955
20. Nelson, A.J. et al., J. Electron Spectroscopy and Related Phenomena, 105(1), 51 (1999)
21. Heske, C. et al., Surf. Interface Anal., 30, 459 (2000)
22. Klein, A. et al. in proc. of 14. Europ. Photovolt. Solar Energy Conf. 1997. 1705
23. Klein, A. et al. in proc. of 14. Europ. Photovolt. Solar Energy Conf. 1997. 2068
24. Säuberlich, F. et al., Thin Solid Films, 431-432, 378 (2003)
25. Nelson, A.J. et al., J. Appl. Phys., 74(9), 5757 (1993)
26. Nelson, A.J. et al. in proc. of 24th IEEE Photovoltaic Specialists Conf. 1994. 279
27. Loher, T. et al., J. Appl. Phys., 77(2), 731 (1995)
28. Saltas, V. et al., Surf. Rev. and Letters, 7, 235 (2000)
29. Nelson, A.J. et al., J. Vac. Sci. Technol. A, 13(4), 1990 (1995)
30. Nelson, A.J., Appl. Phys. Lett., 70(14), 1873 (1997)
31. Nelson, A.J. et al., J. Appl. Phys., 73(12), 8561 (1993)
32. Löher, T. et al., J. Appl. Phys., 81(12), 7806 (1997)
33. Meisel, A. et al., X-ray Spectra and Chemical Binding. Chemical Physics, ed. R. Gomer. 1989: Springer-Verlag.
34. Crisp, R. et al., Solid State Commun.,83(12), 1035 (1992)
35. Heske, C., Appl. Phys. A, 78, 829 (2004)
36. Gullikson, E., X-ray interactions with matter, 2004, :http://www.cxro.lbl.pov/optical_constants/atten2.html
37. Crisp, R. et al., Solid State Commun., 78, 465 (1991)
38. Heske, C. et al., Appl. Phys. Lett., 75(14), 2082 (1999)
39. Heske, C. et al., Appl. Phys. Lett., 74(10), 1451 (1999)
40. Zhang, L. et al., BESSY User Meeeting, Berlin, 2004
41. Reichardt, J. et al., Appl. Phys. Lett. 86, 172102 (2005)
42. Ramanathan, K. et al. in proc. of 26th IEEE PVSC. 1997. Anaheim, USA. 319
43. Rusu, M. et al., Thin Solid Films, 451-452, 556 (2004)
44. Würz, R. et al., Phys. Rev. B, 70, 205321 (2004)
45. Bär, M. et al. in proc. of 3 Ist IEEE PVSC. 2005. Lake Buena Vista, USA. in press
46. Bär, M. et al., Prog. Photovolt.: Res. Appl., (in press 2005)
47. Bär, M. et al., Appl. Phys. Lett., (submitted 2005)
48. Pistor, P., Quantitative analysis of soft x-ray emission spectra applied to chalcopyrite solar cell materials, Diplomarbeit, Freie Universität, Berlin, 2004
49. Weast, R.C., ed. Handbook of Chemistry and Physics. Vol. 1. 1986, CRC Press, Inc.: Boca Raton, Florida.