Semi-quantitative and non-destructive analysis of impurities at a buried interface: Na and the CdS/Cu(In,Ga)Se2 heterojunction

Surface and Interface Analysis

Volumn 30, Issue 1, 2000, Pages 459-463

  Heske, C ^a,f   Eich, D ^a   Fink, R ^a   Umbach, E ^a   Van Buuren, T ^b   Bostedt, C ^b   Kakar, S ^b   Terminello, L J ^b   Grush, M M ^c   Callcott, T A ^c   Himpsel, F J ^d   Ederer, D L ^e   Perera, R C C ^f   Riedl, W ^g   Karg, F ^h  

^a UNIVERSITY OF WÜRZBURG   (Germany)

^b LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

^c UNIVERSITY OF TENNESSEE   (United States)

^d University of Wisconsin Madison   (United States)

^e TULANE UNIVERSITY   (United States)

^f LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^g SIEMENS AG   (Germany)

^h SHELL GLOBAL SOLUTIONS INTERNATIONAL B V   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EMISSION SPECTROSCOPY; IMPURITIES; INTERFACES (MATERIALS); NONDESTRUCTIVE EXAMINATION; PHOTOELECTRON SPECTROSCOPY; SOLAR CELLS; THIN FILMS; X RAY SPECTROSCOPY;

BURIED INTERFACES;

HETEROJUNCTIONS;

EID: 18744417907     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/1096-9918(200008)30:1<459::AID-SIA757>3.0.CO;2-L     Document Type: Article

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