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Volumn 867, Issue , 2005, Pages 123-128

Frictional behavior and particle adhesion of abrasive particles during Cu CMP

Author keywords

[No Author keywords available]

Indexed keywords

ABRASIVES; ADHESION; ADSORPTION; CONTAMINATION; COPPER; SILICON WAFERS;

EID: 30544433075     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-867-w6.2     Document Type: Conference Paper
Times cited : (2)

References (7)
  • 5
    • 0032050490 scopus 로고    scopus 로고
    • Y. Ando, J. Ino, Wear. 216, 115-122, (1998)
    • (1998) Wear. , vol.216 , pp. 115-122
    • Ando, Y.1    Ino, J.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.