|
Volumn 867, Issue , 2005, Pages 123-128
|
Frictional behavior and particle adhesion of abrasive particles during Cu CMP
a a a a |
Author keywords
[No Author keywords available]
|
Indexed keywords
ABRASIVES;
ADHESION;
ADSORPTION;
CONTAMINATION;
COPPER;
SILICON WAFERS;
CITRATE IONS;
CITRIC ACID;
FRICTION BEHAVIOR;
CHEMICAL MECHANICAL POLISHING;
|
EID: 30544433075
PISSN: 02729172
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1557/proc-867-w6.2 Document Type: Conference Paper |
Times cited : (2)
|
References (7)
|