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Volumn 126, Issue 22, 2004, Pages 7063-7070

NMR analysis of surfaces and interfaces in 2-nm CdSe

Author keywords

[No Author keywords available]

Indexed keywords

CORRELATION METHODS; INTERFACES (MATERIALS); NANOSTRUCTURED MATERIALS; NUCLEAR MAGNETIC RESONANCE; POLARIZATION;

EID: 3042854383     PISSN: 00027863     EISSN: None     Source Type: Journal    
DOI: 10.1021/ja037228h     Document Type: Article
Times cited : (120)

References (44)
  • 43
    • 3042803589 scopus 로고    scopus 로고
    • note
    • 3v point group symmetry and the lattice parameters a = 4.3A, c = 7.0A were used for this estimate.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.