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Volumn 21, Issue , 2003, Pages 183-190

Evaluation of mechanical quality of CMP pads using acoustic techniques

Author keywords

[No Author keywords available]

Indexed keywords

DYNAMIC MECHANICAL ANALYSIS (DMA); FLEXURAL DEFORMATION; POLISHING PADS; WAFER PLANARITY;

EID: 3042808747     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (1)

References (10)
  • 4
    • 3042806589 scopus 로고
    • W. O' Mara, Semiconductor Int. 7 (1994) 140M. Desai, R. Jairath, M. Stell, and R. Tolles, Advanced Metallization of Devices and Circuits- Science Technology and Manufacturability, p. 99
    • (1994) Semiconductor Int. , vol.7 , pp. 140
    • O'Mara, W.1
  • 10
    • 33646219523 scopus 로고    scopus 로고
    • MS Thesis, University of South Florida, Tampa, FL, May
    • D Totzke, MS Thesis, University of South Florida, Tampa, FL, May 2000
    • (2000)
    • Totzke, D.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.