Ultraprecise atomic mass measurement of the α particle and 4He

Physical Review Letters

Volumn 92, Issue 22, 2004, Pages

  Van Dyck Jr , R S ^a   Zafonte, S L ^a   Van Liew, S ^a   Pinegar, D B ^a   Schwinberg, P B ^a  

^a UNIVERSITY OF WASHINGTON   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGED PARTICLES; ELECTRIC POTENTIAL; ERROR ANALYSIS; HELIUM; IONS; MAGNETIC FIELDS; PROBABILITY; RESONANCE; STATISTICAL METHODS;

ATOMIC MASS; CYCLOTRON FREQUENCY; FIELD EMISSION POINT (FEP); SINGLE-IONS;

MASS SPECTROMETERS;

EID: 3042752780     PISSN: 00319007     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevLett.92.220802     Document Type: Article

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