An Ion Balance for Ultra-High-Precision Atomic Mass Measurements

Science

Volumn 303, Issue 5656, 2004, Pages 334-338

  Rainville, Simon ^a,b   Thompson, James K ^a   Pritchard, David E ^a  

^a MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

^b HARVARD UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ACOUSTIC NOISE; CHEMICAL BONDS; MAGNETIC FIELDS; MAGNETRONS; MASS SPECTROMETRY;

ATOMIC MASS MEASUREMENTS;

CYCLOTRONS;

PRECISION;

ACCURACY; ARTICLE; CHEMICAL BOND; CYCLOTRON; MAGNETIC FIELD; MASS SPECTROMETRY; MEASUREMENT; MICROWAVE OVEN; MOLECULAR INTERACTION; MOLECULAR WEIGHT; PHYSICS; PRIORITY JOURNAL;

EID: 0346373758     PISSN: 00368075     EISSN: None     Source Type: Journal    
DOI: 10.1126/science.1092320     Document Type: Article

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35. We acknowledge with gratitude that the experimental and measurement technologies that have made these experiments possible are the result of about 20 years of effort by previous group members, especially the detector technology developed by M. P. Bradley and J. V. Porto. We thank E. G. Myers for many helpful comments on the manuscript. This work was supported by NSF and was formerly supported by the National Institute of Science and Technology and the Joint Services Electronics Program, S.R. acknowledges the support of the Fonds pour la Formation de Chercheur et l'Aide à la Recherche.