메뉴 건너뛰기




Volumn 132, Issue 1-4, 2001, Pages 231-244

Recent progress with the SMILETRAP penning mass spectrometer

Author keywords

EBIS produced ions; Penning trap; Precision mass measurements

Indexed keywords

ARGON; CESIUM; GERMANIUM; HELIUM; KRYPTON; NEON; SELENIUM; SILICON;

EID: 0034760889     PISSN: 03043843     EISSN: None     Source Type: Journal    
DOI: 10.1007/978-94-015-1270-1_19     Document Type: Conference Paper
Times cited : (4)

References (17)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.