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Volumn 132, Issue 1-4, 2001, Pages 231-244
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Recent progress with the SMILETRAP penning mass spectrometer
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Author keywords
EBIS produced ions; Penning trap; Precision mass measurements
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Indexed keywords
ARGON;
CESIUM;
GERMANIUM;
HELIUM;
KRYPTON;
NEON;
SELENIUM;
SILICON;
AIRFLOW;
ATMOSPHERIC PRESSURE;
CONFERENCE PAPER;
DEVICE;
ELECTRON CAPTURE DETECTION;
MASS SPECTROMETER;
THERMODYNAMICS;
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EID: 0034760889
PISSN: 03043843
EISSN: None
Source Type: Journal
DOI: 10.1007/978-94-015-1270-1_19 Document Type: Conference Paper |
Times cited : (4)
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References (17)
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