Penning trap measurements of the masses of 133Cs, 87,85Rb, and 23Na with uncertainties ≤0.2 ppb

Physical Review Letters

Volumn 83, Issue 22, 1999, Pages 4510-4513

  Bradley, Michael P ^a   Porto, James V ^a,b   Rainville, Simon ^a   Thompson, James K ^a   Pritchard, David E ^a  

^a MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

^b NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001045772     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.83.4510     Document Type: Article

References (32)

1. T. Kinoshita, Rep. Prog. Phys. 59, 1459, (1996).
2. T. Kinoshita, IEEE Trans. Instrum. Meas. 46, 108, (1997).
3. T. Kinoshita, Phys. Rev. Lett. 75, 4728, (1995).
4. R. S. Van Dyck, Jr. P. B. Schwinberg, and H. G. Dehmelt, Phys. Rev. Lett. 59, 26, (1987).
5. M. E. Cage, et al. IEEE Trans. Instrum. Meas. 38, 284, (1989).
6. A. Jeffery, et al. IEEE Trans. Instrum. Meas. 46, 264, (1997).
7. E. Kruger, W. Nistler, and W. Weirauch, Metrologia. 35, 203, (1998).
8. B. N. Taylor, Metrologia. 31, 181, (1994).
9. C. Schwob, et al. Phys. Rev. Lett. 82, 4960, (1999).
10. Th. Udem, et al. Phys. Rev. Lett. 79, 2646, (1997).
11. D. L. Farnham, R. S. Van Dyck, Jr. and P. B. Schwinberg, Phys. Rev. Lett. 75, 3598, (1995).
12. F. DiFilippo, V. Natarajan, K. R. Boyce, and D. E. Pritchard, Phys. Rev. Lett. 73, 1481, (1994).
13. R. S. Van Dyck, Jr. D. L. Farnham, S. Zafonte, and P. B. Schwinberg, ICAP XVI Abstracts, Windsor, 1998 (University of Windsor, Windsor, 1998), pp. 294–295.
14. R. S. Van Dyck, Jr. D. L. Farnham, and P. B. Schwinberg, Abstracts of the American Physical Society, 1993 (American Physical Society, Ridge, NY, 1993).
15. G. L. Greene, E. G. Kessler, Jr. R. D. Deslattes, and H. Börner, Phys. Rev. Lett. 56, 819, (1986).
16. D. Weiss, B. Young, and S. Chu, Phys. Rev. Lett. 70, 2706, (1993).
17. D. Weiss, B. Young, S. Chu, Appl. Phys. B. 59, 217, (1994).
18. Th. Udem, J. Reichert, R. Holzwarth, and T. W. Hänsch, Phys. Rev. Lett. 82, 3568, (1999).
19. B. C. Young, Ph.D. thesis, Stanford, 1997.
20. G. Audi, and A. G. Wapstra, Nucl. Phys. A565, 1, (1993).
21. E. R. Williams, R. L. Steiner, D. B. Newell, and P. T. Olsen, Phys. Rev. Lett. 81, 2404, (1998).
22. H. Stolzenberg, et al. Phys. Rev. Lett. 65, 3104, (1990).
23. B. Fogelberg, et al. Phys. Rev. Lett. 82, 1823, (1999).
24. L. S. Brown, and G. Gabrielse, Rev. Mod. Phys. 58, 233, (1986).
25. E. A. Cornell, R. M. Weisskoff, K. R. Boyce, and D. E. Pritchard, Phys. Rev. A. 41, 312, (1990).
26. P. R. Bevington, and D. K. Robinson, Data Reduction and Error Analysis for the Physical Sciences (McGraw-Hill, Boston, 1992), 2nd ed.
27. P. J. Huber, Robust Statistics (Wiley, New York, 1981).
28. V. Natarajan, K. R. Boyce, F. DiFilippo, and D. E. Pritchard, Phys. Rev. Lett. 71, 1998, (1993).
29. S. G. Lias, et al. in NIST Chemistry WebBook, NIST Standard Reference Database No. 69.
30. W. G. Mallard, and P. J. Linstrom, (NIST, Gaithersburg, MD, 1998), (http://webbook.nist.gov).
31. C. Carlberg, T. Fritioff, and I. Bergstrom, preceding Letter, Phys. Rev. Lett. 83, 4506, (1999).
32. Thomas Udem, (private communication).