Epitaxial growth of YBa2Cu3O7-δ thin films on silicon-on-insulator substrates by pulsed laser deposition

Superconductor Science and Technology

Volumn 17, Issue 6, 2004, Pages 804-807

  Wang, P ^a,b   Li, J ^a   Peng, W ^a   Chen, K ^a,c   Lang, P L ^a   Xiang, J Y ^a   Chen, Y F ^a   Xu, X P ^a   Tian, H Y ^a   Zheng, D N ^a  

^a INSTITUTE OF PHYSICS   (China)

^b Yanbei Normal Institute   (China)

^c UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRACKS; EPITAXIAL GROWTH; PULSED LASER DEPOSITION; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; SCANNING ELECTRON MICROSCOPY; SILICON ON INSULATOR TECHNOLOGY; THERMAL EXPANSION; THIN FILMS; X RAY DIFFRACTION ANALYSIS; YTTRIUM BARIUM COPPER OXIDES;

COOLING RATES; LATTICE ORIENTATION; SEMICONDUCTOR INDUSTRY;

SUPERCONDUCTING FILMS;

EID: 3042691927     PISSN: 09532048     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-2048/17/6/012     Document Type: Article

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